Xiaochuan Chen , MarkS. Drew , Ze-Nian Li , GrahamD. Finlayson
electronic imaging 2016 ( 20) 1 -8
Mark Drew, Jr. , Kevin G. Kemp
Integrated Circuit Metrology, Inspection, and Process Control VII 1926 422 -428
John A. Allgair , David C. Benoit , Mark Drew, Jr. , Robert R. Hershey
Metrology, inspection, and process control for microlothoggraphy. Conference 4344 462 -471
Arnold W. Yanof , Kevin D. Cummings , Philip A. Seese , Matthew A. Thompson
Electron-Beam, X-Ray, and Ion-Beam Submicrometer Lithographies for Manufacturing IV 2194 36 -50
M S Drew
Journal of Physics A 16 ( 1)
MARK S. DREW , GRAHAM D. FINLAYSON
International Journal of Image and Graphics 11 ( 04) 589 -609
Mingjing Zhang , Mark S Drew
Eurasip Journal on Image and Video Processing 2014 ( 1) 25
Mark S Drew
Annals of Physics 103 ( 2) 469 -495
Jan-Olof Eklundh , Yiannis Aloimonos , Nicholas Ayache , Ruzena Bajcsy
Graham D Finlayson , Mark S Drew , Brian V Funt
JOSA A 11 ( 5) 1553 -1563
Graham D Finlayson , Mark S Drew , Brian V Funt
Human Vision, Visual Processing, and Digital Display IV 1913 473 -484
Brian V Funt , Jian Ho , Mark S Drew
Mark S Drew , Brian V Funt
JOSA A 9 ( 8) 1255 -1265
Ghalia Hemrit , Graham D Finlayson , Arjan Gijsenij , Peter Gehler
IEEE transactions on pattern analysis and machine intelligence 42 ( 5) 1286 -1287
Graham D Finlayson , Janet Dueck , Brian V Funt , Mark S Drew
Elsevier Science Ltd 607 -610
Steven Bergner , Torsten Möller , Mark S Drew
Technical Report SFUCMPT-TR2004-06, School Of Computing Science, Simon Fraser University
Steven Bergner , Mark S Drew , Torsten Möller
Ze-Nian Li , Mark S Drew , Jiangchuan Liu , Ze-Nian Li
Springer, Cham 479 -504
Ze-Nian Li , Mark S Drew , Jiangchuan Liu , Ze-Nian Li
Springer, Cham 119 -149
Ze-Nian Li , Mark S Drew , Jiangchuan Liu , Ze-Nian Li
Springer, Cham 301 -339