Maksim Jenihhin
机构: Dept. of Computer Systems, Tallinn University of Technology
每年引用次数
引用次数
引用: 912
H-指数: 15
I10-指数 : 33
出版物: 201
Test time minimization for hybrid BIST of core-based systems
Jervan , Eles , Peng , Ubar
asian test symposium 21 ( 6) 318 -323
36
2003
Keynote Presentations
Daniel D GAJSKI , Krishnendu CHAKRABARTY , Janusz RAJSKI , Marco BUCCI
Letícia BOLZANI Luciano CAIMI Luiz Filipe VIEIRA Luz BALADO
Adoracion RUEDA , Alain BRUN , Alex ORAILOGLU , André IVANOV
EEG Analyzer prototype based on FPGA
Maksim Jenihhin , Hiie Hinrikus , Dmitri Mihhailov , Vadim Pesonen
international symposium on image and signal processing and analysis 101 -106
5
2011
Dependability evaluation in fault-tolerant systems with high-level decision diagrams
Maksim Jenihhin , Jaan Raik , Raimund Ubar , Gert Jervan
Computer science meets automation: 52. IWK, Internationales Wissenschaftliches Kolloquium ; proceedings ; 10 - 13 September 2007 / Faculty of Computer Science and Automation, [Technische Universität Ilmenau. Hrsg.: Peter Scharff].#R#<br/>Ilmenau : Univ.-Verl., 2007#R#<br/>ISBN 978-3-939473-17-6#R#<br/>Vol. II#R#<br/>S. 147-152 147 -152
2007
Multi-Fragment Markov Model Guided Online Test Generation for MPSoC.
Maksim Jenihhin , Jaan Raik , Leonidas Tsiopoulos , Jüri Vain
ICTERI 594 -607
1
2017
High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors
Maksim Jenihhin , Jaan Raik , Raimund Ubar , Adeboye Stephen Oyeniran
european test symposium 1 -6
2
2019
Accelerating Transient Fault Injection Campaigns by using Dynamic HDL Slicing
Maksim Jenihhin , Jaan Raik , Ahmet Cagri Bagbaba , Christian Sauer
international symposium on system on chip 1 -7
3
2019
Early RTL Analysis for SCA Vulnerability in Fuzzy Extractors of Memory-Based PUF Enabled Devices
Maksim Jenihhin , Sven Goossens , Roel Maes , Kolin Paul
ifip ieee international conference on very large scale integration 16 -21
2020
Definition of the DIAMOND Platform
Maksim Jenihhin , Jaan Raik , Robert Könighofer , Alexander Finder
2010
Gate-Level Graph Representation Learning: A Step Towards the Improved Stuck-at Faults Analysis
Maksim Jenihhin , Maximilien Glorieux , Dan Alexandrescu , Thomas Lange
international symposium on quality electronic design 24 -30
2021
Rejuvenation of NBTI-Impacted Processors Using Evolutionary Generation of Assembler Programs
Francesco Pellerey , Maksim Jenihhin , Giovanni Squillero , Jaan Raik
asian test symposium 304 -309
5
2016
A scalable model based RTL framework zamiaCAD for static analysis
Anton Tsepurov , Gunter Bartsch , Rainer Dorsch , Maksim Jenihhin
2012 IEEE/IFIP 20th International Conference on VLSI and System-on-Chip (VLSI-SoC) 171 -176
14
2012
Upgrading QoSinNoC: Efficient Routing for Mixed-Criticality Applications and Power Analysis
Serhiy Avramenko , Siavoosh Payandeh Azad , Behrad Niazmand , Massimo Violante
ifip ieee international conference on very large scale integration 207 -212
2
2018
On NBTI-induced Aging Analysis in IEEE 1687 Reconfigurable Scan Networks
Aleksa Damljanovic , Giovanni Squillero , Cemil Cem Guursoy , Maksim Jenihhin
ifip ieee international conference on very large scale integration 335 -340
2019
BASTION: Board and SoC test instrumentation for ageing and no failure found
Artur Jutman , Christophe Lotz , Erik Larsson , Matteo Sonza Reorda
design, automation, and test in europe 115 -120
2
2017
A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs
Guilherme Cardoso Medeiros , Cemil Cem Gursoy , Lizhou Wu , Moritz Fieback
design, automation, and test in europe 792 -797
1
2020
APRICOT: A framework for teaching digital systems verification
Jaan Raik , Maksim Jenihhin , Anton Chepurov , Uljana Reinsalu
2008 19th EAEEIE Annual Conference 172 -177
1
2008
Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks
Felipe Augusto da Silva , Ahmet Cagri Bagbaba , Annachiara Ruospo , Riccardo Mariani
vlsi test symposium 1 -9
2020
Constraint-based test pattern generation at the Register-Transfer Level
Taavi Viilukas , Jaan Raik , Maksim Jenihhin , Raimund Ubar
design and diagnostics of electronic circuits and systems 352 -357
7
2010
Jaan Raik Raimund Ubar Gert Jervan Matteo SONZA REORDA Artur Jutman Peeter Ellervee Sergei Kostin Zebo Peng Franco Fummi Sergei Devadze Graziano Pravadelli Giovanni Squillero Uljana Reinsalu Petru Eles Ernesto Sanchez Guilherme Cardoso Medeiros Witold A. Pleskacz Wuttke, Heinz-Dietrich Goerschwin Fey Hideo Fujiwara 藤原秀雄