Francesc Perez-Murano

机构: IMB-CNM, CSIC

每年引用次数

引用次数

引用: 6,790

H-指数: 41

I10-指数 : 136

出版物: 407

Measurements of electrical conductivity of a nanometer-scale water meniscus by atomic force microscopy

C. Martin , F.P. Murano , J.A. Dagata
international conference on nanotechnology 2 781 -784

2003

Analysis of SERS Substrates Based on Gold Coated Polymer Films Nanostructured by Nanoimprint Lithography.

N. Alayo , Tiberio A. Ezquerra , Marta Castillejo , Esther Rebollar
CSIC-ICN Centro de Investigación en Nanociencia y Nanotecnología (CIN2)

2013

Improving Control on Information Storage in Ferroelectric Polymer Films by using Nanoimprint Lithography.

N. Alayo , Tiberio A. Ezquerra , Daniel E. Martínez-Tong , Daniel R. Rueda
CSIC-ICN Centro de Investigación en Nanociencia y Nanotecnología (CIN2)

2013

Carbon nanotubes as platforms for electrochemical and electronic detection of biorecognition processes

Alessandra Bonanni , I. Martín-Fernández , Manel del Valle , Rosa Villa
Universidad Autónoma de Barcelona

2011

Assessment of Replica Quality in Polymer Gratings Fabricated by Nanoimprint Lithography by means of Grazing Incidence Small Angle X-ray Scattering

Michelina Soccio , Francesc X. Perez Murano , N. Alayo , Tiberio A. Ezquerra
CSIC-ICN Centro de Investigación en Nanociencia y Nanotecnología (CIN2)

2013

Sistema de alineación de patrones en un sustrato mediante litografía por esténcil

Francesc X. Perez Murano , Marc Van den Boogart , Arantxa Uranga del Monte , Núria Barniol Beumala

2010

Gold/Polymer Nanogratings fabricated by Nanoimprint Lithography for application as Surface Enhanced Raman Scattering sensors

N. Alayo , Tiberio A. Ezquerra , Marta Castillejo , Esther Rebollar

2014

Fluent solver expanded to the nano-world

J. Fraxedas , C. Colominas , Francesc X. Perez Murano , J. Pina-Estany

2016

Submodelling simulation of plastic injection for nano roughness replication

J. Fraxedas , C. Colominas , Francesc X. Perez Murano , J. Pina-Estany

2016

Simulation of plastic injection for nanostructure pattern replication

J. Fraxedas , C. Colominas , Francesc X. Perez Murano , J. Pina-Estany

2015

Simulation of plastic injection for nano roughness replication

J. Fraxedas , C. Colominas , Francesc X. Perez Murano , J. Pina-Estany

2016

Continuous tip monitoring and sensing of surface mechanical properties during Atomic Force Microscopy imaging using higher harmonics

J. Fraxedas , Matteo Lorenzoni , Federico Gramazio , Francesc X. Perez Murano
CSIC-ICN Centro de Investigación en Nanociencia y Nanotecnología (CIN2)

2016

Self-assembly of block copolymer thin films as revealed by GISAXS

H. Amenitsch , Marta Fernández-Regúlez , J. Fraxedas , Tiberio A. Ezquerra

2017

Block copolymer self-assembly kinetics by GISAXS

Marta Fernández-Regúlez , J. Fraxedas , Tiberio A. Ezquerra , Aurora Nogales

2019

Atomic force microscopy local anodic oxidation of thin Si3N4 layers for robust prototyping of nanostructures

Irene Fernandez-Cuesta , Xavier Borrisé , Francesc Pérez-Murano
Journal of Vacuum Science & Technology B 24 ( 6) 2988 -2992

11

2006

V-groove plasmonic waveguides fabricated by nanoimprint lithography

Irene Fernandez-Cuesta , Rasmus Bundgaard Nielsen , Alexandra Boltasseva , Xavier Borrisé
Journal of Vacuum Science & Technology B 25 ( 6) 2649 -2653

27

2007

Role of penetrability into a brush-coated surface in directed self-assembly of block copolymers

Laura Evangelio , Marta Fernández-Regúlez , Jordi Fraxedas , Marcus Müller
ACS applied materials & interfaces 11 ( 3) 3571 -3581

7

2018

Nanometer‐scale oxidation of Si(100) surfaces by tapping mode atomic force microscopy

F. Pérez‐Murano , G. Abadal , N. Barniol , X. Aymerich
Journal of Applied Physics 78 ( 11) 6797 -6801

76

1995

Nanometer scale lithography of silicon(100) surfaces using tapping mode atomic force microscopy

J. Servat , P. Gorostiza , F. Sanz , F. Pérez‐Murano
Journal of Vacuum Science and Technology 14 ( 3) 1208 -1212

26

1996

Modification of HF‐treated silicon (100) surfaces by scanning tunneling microscopy in air under imaging conditions

N. Barniol , F. Pérez‐Murano , X. Aymerich
Applied Physics Letters 61 ( 4) 462 -464

43

1992

Nanofabrication