引用次数
引用: 5,734
H-指数: 38
I10-指数 : 114
出版物: 228
Finite Orthogonal Series in Design of Digital Devices
Mark Karpovsky
John Wiley & Sons
66
2006
Secure memories resistant to both random errors and fault injection attacks using nonlinear error correction codes
Shizun Ge , Zhen Wang , Pei Luo , Mark Karpovsky
hardware and architectural support for security and privacy 5
9
2013
Asynchronous balanced gates tolerant to interconnect variability
Konrad J. Kulikowski , Vyas Venkataraman , Zheng Wang , Alexander Taubin
international symposium on circuits and systems 3190 -3193
21
2008
Robust FSMs for cryptographic devices resilient to strong fault injection attacks
Zhen Wang , Mark Karpovsky
2010 IEEE 16th International On-Line Testing Symposium 240 -245
13
2010
Algebraic manipulation detection codes and their applications for design of secure cryptographic devices
Zhen Wang , Mark Karpovsky
2011 IEEE 17th International On-Line Testing Symposium 234 -239
36
2011
Multilinear codes for robust error detection
Zhen Wang , Mark Karpovsky , Berk Sunar
international on line testing symposium 164 -169
5
2009
Reliable and secure memories based on algebraic manipulation correction codes
Zhen Wang , Mark Karpovsky
2012 IEEE 18th International On-Line Testing Symposium (IOLTS) 146 -149
15
2012
New byte error correcting codes with simple decoding for reliable cache design
Lake Bu , Mark Karpovsky , Zhen Wang
international on-line testing symposium 200 -205
4
2015
Exhaustive and Near-Exhaustive Memory Testing Techniques and theirBIST Implementations
Debaleena Das , Mark Karpovsky
Journal of Electronic Testing 10 ( 3) 215 -229
16
1997
Deadlock Prevention with Wormhole Routing: Irregular Topology
Lev Levitin , Mark Karpovsky , Mehmet Mustafa
IGI Global 47 -73
2013
Differential Fault Analysis Attack Resistant Architectures for the Advanced Encryption Standard
Mark Karpovsky , Konrad J. Kulikowski , Alexander Taubin
smart card research and advanced application conference 177 -192
79
2004
Detecting bridging and stuck-at faults at input and output pins of standard digital components
Mark Karpovsky , Stephen Y.H. Su
Proceedings of the seventeenth design automation conference on Design automation - DAC '80 494 -505
8
1980
Optimal Turn Prohibition for Deadlock Prevention in Networks With Regular Topologies
Mark Karpovsky , Lev Levitin , Mehmet Mustafa
IEEE Transactions on Control of Network Systems 1 ( 1) 74 -85
5
2014
Fault-tolerant message routing for multiprocessors
Lev Zakrevski , Mark Karpovsky
international parallel processing symposium 714 -730
15
1998
Design of Memories with Concurrent Error Detection and Correction by Nonlinear SEC-DED Codes
Zhen Wang , Mark Karpovsky , Konrad J. Kulikowski
Journal of Electronic Testing 26 ( 5) 559 -580
33
2010
Design of Cryptographic Devices Resilient to Fault Injection Attacks Using Nonlinear Robust Codes
Kahraman D. Akdemir , Zhen Wang , Mark Karpovsky , Berk Sunar
Fault Analysis in Cryptography 171 -199
21
2012
Reliable MLC NAND flash memories based on nonlinear t-error-correcting codes
Zhen Wang , Mark Karpovsky , Ajay Joshi
dependable systems and networks 41 -50
17
2010
Minimal Sets of Turns for Breaking Cycles in Graphs Modeling Networks
Lev Levitin , Mark Karpovsky , Mehmet Mustafa
IEEE Transactions on Parallel and Distributed Systems 21 ( 9) 1342 -1353
16
2010
Correction to “detection and location of input and feedback bridging faults among input and output lines”
Mark Karpovsky , Stephen Y. H. Su
IEEE Transactions on Computers 30 ( 1) 86 -86
1
1981
Self-checking sequential circuits with self-healing ability
Ilya Levin , Vladimir Ostrovsky , Sergey Ostanin , Mark Karpovsky
Proceedings of the 12th ACM Great Lakes Symposium on VLSI - GLSVLSI '02 71 -76
6
2002