Ann N. Chiaramonti
机构: National Institute of Standards and Technology
每年引用次数
引用次数
引用: 1,483
H-指数: 19
I10-指数 : 31
出版物: 78
Effect of Annealing on Transport Properties of MgO-based Magnetic Tunnel Junctions
D. K. Schreiber , William F. Egelhoff , D. N. Seidman , Amanda K. Petford-Long
Applied Physics Letters 93
2008
In situ TEM studies of local transport and structure in nanoscale multilayer films.
A.N. Chiaramonti , L.J. Thompson , W.F. Egelhoff , B.C. Kabius
Ultramicroscopy 108 ( 12) 1529 -1535
10
2008
Atom probe tomography analysis of the reference zircon gj-1: an interlaboratory study
F. Exertier , A. La Fontaine , C. Corcoran , S. Piazolo
Chemical Geology 495 27 -35
10
2018
Integrating carbon nanotubes as vias in a monolithic 3DIC process
S. Vollebregt , R. Ishihara , A.N. Chiaramonti , J. Bin Abdul Jalil
Extended Abstracts of the 2012 International Conference on Solid State Devices and Materials 1170 -1171
2012
Transition from Order to Configurational Disorder for Surface Reconstructions on SrTiO 3 (111)
L. D. Marks , A. N. Chiaramonti , S. U. Rahman , M. R. Castell
Physical Review Letters 114 ( 22) 226101 -226101
26
2015
Organized Carbon Nanotube Networks
Ann N. Chiaramonti , Laila Jaber-Ansari , Mark C. Strus , Moneesh Upmanyu
CRC Press 3478 -3491
2014
Atom Probe Tomography with Extreme-Ultraviolet Light
Ann N. Chiaramonti , David R. Diercks , Luis Miaja-Avila , Brian P. Gorman
conference on lasers and electro optics
2019
Epitaxial (111) films of Cu, Ni, and CuxNiy on α−Al2O3 (0001) for graphene growth by chemical vapor deposition
Ann N. Chiaramonti , Mark W. Keller , Robert R. Keller , David L. Miller
Journal of Applied Physics 112 ( 6) 064317
42
2012
Extreme Ultraviolet Radiation Pulsed Atom Probe Tomography of III-Nitride Semiconductor Materials
Ann N. Chiaramonti , Ashwin Rishinaramangalam , Daniel F. Feezell , Benjamin W. Caplins
Journal of Physical Chemistry C 125 ( 4) 2626 -2635
2021
The loss of negative polarization after depletion of sub-micron-sized particles in regolith simulant
Ann N. Chiaramonti , Antti Penttilä , Karri Muinonen , Olga Muñoz
European Planetary Science Congress
2018
Comparative Apex Electrostatics of Atom Probe Tomography Specimens
Ann N. Chiaramonti , Norman A. Sanford , Benjamin Klein , Qihua Zhang
Journal of Electronic Materials
2021
Optical Scattering Characteristics of 3-D Lunar Regolith Particles Measured Using X-Ray Nano Computed Tomography
Ann N. Chiaramonti , Somen Baidya , Ahmed M. Hassan , Thomas Lafarge
IEEE Geoscience and Remote Sensing Letters
2021
Atom Probe Tomography Using a Wavelength-Tunable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light Source
Ann N. Chiaramonti , Luis Miaja-Avila , Paul T. Blanchard , David R. Diercks
Microscopy and Microanalysis 25 314 -315
2019
Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light.
Ann N. Chiaramonti , Luis Miaja-Avila , Benjamin W. Caplins , Paul T. Blanchard
Microscopy and Microanalysis 26 ( 2) 258 -266
1
2020
Optical Floating Zone Growth of Single Crystal α-Fe2O3 from a CaFe4O7-Based Solvent
Ann N. Chiaramonti , Jason D. Pless , Li Liu , Jared P. Smit
Crystal Growth & Design 4 ( 4) 749 -753
4
2004
A Three-Dimensional Atom Probe Microscope Incorporating a Wavelength-Tuneable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light Source
Ann N. Chiaramonti , Luis Miaja-Avila , Paul T. Blanchard , David R. Diercks
MRS Advances 4 ( 44) 2367 -2375
5
2019
Contact resistance of low-temperature carbon nanotube vertical interconnects
Sten Vollebregt , Ann N. Chiaramonti , Ryoichi Ishihara , Hugo Schellevis
international conference on nanotechnology 1 -5
6
2012
Quantifying the 3-Dimensional Shape of Lunar Regolith Particles Using X-Ray Computed Tomography and Scanning Electron Microscopy at Sub-γ Resolution
Ann N. Chiaramonti , Jay D. Goguen , Edward J. Garboczi
Microscopy and Microanalysis 23 2194 -2195
3
2017
Dominant thermal boundary resistance in multi-walled carbon nanotube bundles fabricated at low temperature
Sten Vollebregt , Sourish Banerjee , Ann N. Chiaramonti , Frans D. Tichelaar
Journal of Applied Physics 116 ( 2) 023514
5
2014
Understanding the High-Temperature Mechanical Properties of A710 (HSLA-80) Steel With Use of Complementary Atom Probe Tomography and Electron Microscopy
Ann N. Chiaramonti , Jeffrey W. Sowards , Daniel K. Schreiber , James R. Fekete
Microscopy and Microanalysis 20 954 -955
1
2014