引用次数
引用: 1,588
H-指数: 21
I10-指数 : 42
出版物: 176
MEMS and NEMS: Nanoscale Sensors and Actuators
Michael Cullinan
CRC Press 2327 -2344
2014
In-line applications of atomic force microscope based topography inspection for emerging roll-to-roll nanomanufacturing processes
Michael Cullinan , Liam G. Connolly
Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV 11611 1161136
2021
Electromagnetic Thermal Energy Transfer in Nanoparticle Assemblies Below Diffraction Limit
Anil Yuksel , Edward T. Yu , Michael Cullinan , Jayathi Murthy
Journal of Thermal Science and Engineering Applications 13 ( 2)
2021
Thermal Transport in Nanoparticle Packings Under Laser Irradiation
Anil Yuksel , Edward T. Yu , Michael Cullinan , Jayathi Murthy
Journal of Heat Transfer 142 ( 3)
3
2020
In-line metrology of nanoscale features in semiconductor manufacturing systems
Tsung-Fu Yao , Andrew Duenner , Michael Cullinan
Precision Engineering-journal of The International Societies for Precision Engineering and Nanotechnology 47 147 -157
34
2017
A tip-based metrology framework for real-time process feedback of roll-to-roll fabricated nanopatterned structures
Liam G. Connolly , Tsung-Fu Yao , Andrew Chang , Michael Cullinan
Precision Engineering 57 137 -148
8
2019
Current challenges and potential directions towards precision microscale additive manufacturing – Part I: Direct ink writing/jetting processes
Dipankar Behera , Michael Cullinan
Precision Engineering-journal of The International Societies for Precision Engineering and Nanotechnology 68 326 -337
16
2021
Use of detailed particle melt modeling to calculate effective melt properties for powders
Daniel Moser , Anil Yuksel , Michael Cullinan , Jayathi Murthy
Journal of Heat Transfer-transactions of The Asme 140 ( 5) 052301
10
2018
Effect of substrate and nanoparticle spacing on plasmonic enhancement in three-dimensional nanoparticle structures
Anil Yuksel , Edward T. Yu , Jayathi Murthy , Michael Cullinan
Journal of Micro and Nano-Manufacturing 5 ( 4) 040903
9
2017
Effect of particle size distribution on near-field thermal energy transfer within the nanoparticle packings
Anil Yuksel , Edward T. Yu , Michael Cullinan , Jayathi Murthy
Journal of Photonics for Energy 9 ( 03) 032707
9
2019
Effect of Interfacial Thermal Conductance Between the Nanoparticles
Anil Yuksel , Edward T. Yu , Michael Cullinan , Jayathi Murthy
ASME 2018 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems
2018
Plasmonic Waveguiding in Subwavelength Particles Suspended in Various Dielectric Media
Anil Yuksel , Michael Cullinan , Edward T. Yu , Jayathi Murthy
ASME 2019 Heat Transfer Summer Conference
2019
Design of Tool for Exfoliation of Monocrystalline Microscale Silicon Films
Martin Ward , Michael Cullinan
Journal of Micro and Nano-Manufacturing 7 ( 1) 011003
2019
In-plane Thermal Conductivity Measurement with Nanosecond Grating Imaging Technique
Jihoon Jeong , Ke Chen , Emily S. Walker , Nilabh Roy
Nanoscale and Microscale Thermophysical Engineering 22 ( 2) 83 -96
3
2018
Analysis of near-field thermal energy transfer within the nanoparticles
Anil Yuksel , Michael Cullinan , Edward T. Yu , Jayathi Y. Murthy
2017 SPIE Optics + Photonics conference on Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XV 10346 110
2
2017
Expanded area metrology for tip-based wafer inspection in the nanomanufacturing of electronic devices
Tsung-Fu Yao , Liam G. Connolly , Michael Cullinan
Journal of Micro-nanolithography Mems and Moems 18 ( 3) 034003
3
2019
The Effects of Variability in Plasmonic Nanoparticle Packing on Optical Scattering and Extinction Cross Section
Anil Yuksel , Edward T. Yu , Michael Cullinan , Jayathi Murthy
IEEE Transactions on Components, Packaging and Manufacturing Technology 10 ( 8) 1388 -1393
2020
Polarization Effect on Out of Plane Configured Nanoparticle Packing
Anil Yuksel , Michael Cullinan , Jayathi Murthy
ASME 2017 12th International Manufacturing Science and Engineering Conference, MSEC 2017 collocated with the JSME/ASME 2017 6th International Conference on Materials and Processing
1
2017
Design of a Tip Based In-Line Metrology System for Roll-to-Roll Manufactured Flexible Electronic Devices
Liam G. Connolly , Michael Cullinan
ASME 2017 12th International Manufacturing Science and Engineering Conference, MSEC 2017 collocated with the JSME/ASME 2017 6th International Conference on Materials and Processing
2017
Laser sintering of copper nanoparticles: A simplified model for fluence estimation and validation
Nilabh Roy , William Jou , He Feng , Jihoon Jeong
ASME 2017 12th International Manufacturing Science and Engineering Conference, MSEC 2017 collocated with the JSME/ASME 2017 6th International Conference on Materials and Processing
3
2017