2
2011
Atomic-Resolution Composition Mapping in EDS STEM
Nathan R Lugg , Akihito Kumamoto , Ryo Ishikawa , Bin Feng
Microscopy and Microanalysis 22 1432 -1433
2016
Quantitative Elemental Mapping at Atomic Resolution Using X-Ray Spectroscopy
G. Kothleitner , M. J. Neish , N. R. Lugg , S. D. Findlay
Physical Review Letters 112 ( 8) 085501
86
2014
The Quest for Quantitative Figures on atomic resolution inelastic STEM images
Werner Grogger , N.R. Lugg , Ferdinand Hofer , S.D. Findlay
Microscopy Conference 2015: MC15 528 -528
2015
Quantitative atomic scale inelastic STEM imaging
Werner Grogger , N.R. Lugg , Ferdinand Hofer , Scott D. Findlay
FEMMS 2015
2015
Removing the effects of elastic and thermal scattering from spectrum images in scanning transmission electron microscopy
Werner Grogger , T. Mizoguchi , N.R. Lugg , Ferdinand Hofer
International Microscopy Congress 2014
2014
Scanning transmission electron microscopy at atomic resolution
Werner Grogger , N.R. Lugg , S.D. Findlay , L.J. Allen
3rd European Conference on NanoFilms
2014
Understanding Imaging and Energy-loss Spectra Due to Phonon Excitation
L.J. Allen , B.D. Forbes , S.D. Findlay , H.G. Brown
Microscopy and Microanalysis 23 1536 -1537
2017
Energy-filtered transmission electron microscopy based on inner-shell ionization
N.R. Lugg , B. Freitag , S.D. Findlay , L.J. Allen
Ultramicroscopy 110 ( 8) 981 -990
13
2010
Scanning transmission electron microscopy imaging dynamics at low accelerating voltages.
N.R. Lugg , S.D. Findlay , N. Shibata , T. Mizoguchi
Ultramicroscopy 111 ( 8) 999 -1013
6
2011
Prospects for lithium imaging using annular bright field scanning transmission electron microscopy: a theoretical study.
S.D. Findlay , N.R. Lugg , N. Shibata , L.J. Allen
Ultramicroscopy 111 ( 8) 1144 -1154
32
2011
Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images.
H. E , K.E. MacArthur , T.J. Pennycook , E. Okunishi
Ultramicroscopy 133 109 -119
92
2013
On the quantitativeness of EDS STEM
N.R. Lugg , G. Kothleitner , N. Shibata , Y. Ikuhara
Ultramicroscopy 151 150 -159
73
2015
A new method to detect and correct sample tilt in scanning transmission electron microscopy bright-field imaging
H.G. Brown , R. Ishikawa , G. Sánchez-Santolino , N.R. Lugg
Ultramicroscopy 173 76 -83
18
2017
On the quantitativeness of grain boundary chemistry using STEM EDS: A ZrO2 Σ9 model grain boundary case study.
B. Feng , N.R. Lugg , A. Kumamoto , N. Shibata
Ultramicroscopy 193 33 -38
2
2018
Atomic-Resolution STEM-EDS Mapping of Grain Boundary Solute Segregation in Yttria-Stabilized Zirconia (Retraction of Vol 21, Pg 2281, 2015)
B Feng , A Kumamoto , N Lugg , N Shibata
MICROSCOPY AND MICROANALYSIS 21 E1 -E1
2015
Direct Observation of Oxygen Vacancy Distribution across Yttria-Stabilized Zirconia Grain Boundaries
Bin Feng , Nathan R. Lugg , Akihito Kumamoto , Yuichi Ikuhara
ACS Nano 11 ( 11) 11376 -11382
52
2017
Atomic-resolution STEM-EDS mapping of grain boundary solute segregation in yttria-stabilized zirconia
Bin Feng , Akihito Kumamoto , Nathan R. Lugg , Naoya Shibata
Microscopy and Microanalysis 21 2283 -2284
2015
Practical aspects of removing the effects of elastic and thermal diffuse scattering from spectroscopic data for single crystals.
Nathan R. Lugg , Melissa J. Neish , Scott D. Findlay , Leslie J. Allen
Microscopy and Microanalysis 20 ( 4) 1078 -1089
9
2014
Interfacial Atomic Structure of Twisted Few-Layer Graphene.
Ryo Ishikawa , Nathan R. Lugg , Kazutoshi Inoue , Hidetaka Sawada
Scientific Reports 6 ( 1) 21273 -21273
9
2016