Peter Anastasi_ Silson Ltd., UK

Joy C Andrews , Sadao Aoki , Tohru Araki , Hans C Arora

Probing nanoscale structural and order

Pascal ANDREAZZA , Christine MOTTET , Caroline ANDREAZZA-VIGNOLLE , Jose PENUELAS
Physical review B. Condensed matter and materials physics 82 ( 15)

2010
Technique for Etching Monolayer and Multilayer Materials

Raymond P. Conley , Ralu Divan , Albert T. Macrander , Nathalie Christine Dominique Bouet

1
2012
X-ray filter for x-ray powder diffraction

John Jay Sinsheimer , Raymond P Conley , Nathalie Christine Dominique Bouet , Eric Y Dooryhee

2019
Technique for etching monolayer and multilayer materials

Nathalie CD Bouet , Raymond P Conley , Ralu Divan , Albert Macrander

9
2015
X-Ray Filter For X-Ray Powder Diffraction

John Jay Sinsheimer , Raymond P Conley , Nathalie CD Bouet , Eric Dooryhee

1
2015
X-ray filter for x-ray powder diffraction

John Jay Sinsheimer , Raymond P Conley , Nathalie CD Bouet , Eric Dooryhee

1
2018
RISE: robust iterative surface extension for sub-nanometer X-ray mirror fabrication.

Qian Kemao , Nathalie Bouet , Heejoo Choi , Dae Wook Kim
Optics Express 29 ( 10) 15114 -15132

14
2021
Focusing of hard x-rays with monolithic two-dimensional multilayer Laue lenses: technical challenges and current status

Weihe Xu , Wei Xu , Nathalie Bouet , Juan Zhou
X-Ray Nanoimaging: Instruments and Methods IV 11112

2019
X-ray microscopy instrumentation developments at NSLS-II: recent progress and future directions

Evgeny Nazaretski , Weihe Xu , Hanfei Yan , Xiaojing Huang
X-Ray Nanoimaging: Instruments and Methods IV 11112

2019
One-dimensional ion-beam figuring solution from Brookhaven National Laboratory

Tianyi Wang , Lei Huang , Matthew Vescovi , Dennis Kuhne
Advances in Metrology for X-Ray and EUV Optics VIII 11109 1110909

2019
Exotic X-ray back-diffraction: a path toward a soft inelastic X-ray scattering spectrometer

Marcelo Goncalves Hönnicke , Raymond Conley , Cesar Cusatis , Edson Massayuki Kakuno
Journal of Applied Crystallography 47 ( 5) 1658 -1665

1
2014
X‐ray back‐diffraction: can we further increase the energy resolution by tuning the energy slightly below that of exact backscattering?

Marcelo Goncalves Hönnicke , Cesar Cusatis , Raymond Conley , Edson Massayuki Kakuno
Journal of Applied Crystallography 52 ( 6) 1321 -1328

2019
Characterization of electron microscopes with binary pseudo-random multilayer test samples

Valeriy V. Yashchuk , Raymond Conley , Erik H. Anderson , Samuel K. Barber
Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment 649 ( 1) 150 -152

7
2011
Multilayer Laue Lens: A Brief History and Current Status

Ray Conley , Nathalie Bouet , Yong S. Chu , Xiaojing Huang
Synchrotron Radiation News 29 ( 4) 16 -20

13
2016
Achieving diffraction-limited nanometer-scale X-ray point focus with two crossed multilayer Laue lenses: alignment challenges.

Hanfei Yan , Xiaojing Huang , Nathalie Bouet , Juan Zhou
Optics Express 25 ( 21) 25234 -25242

22
2017
11
2020
Integration of ptychography with the nanoscale multimodality imaging instrument at HXN of NSLS-II (Conference Presentation)

Xiaojing Huang , Hanfei Yan , Evgeny Nazaretski , Mingyuan Ge
X-Ray Nanoimaging: Instruments and Methods III 10

2017
Multimodality hard-x-ray imaging of a chromosome with nanoscale spatial resolution

Hanfei Yan , Evgeny Nazaretski , Kenneth Lauer , Xiaojing Huang
Scientific Reports 6 ( 1) 20112 -20112

62
2016