引用次数
引用: 1,932
H-指数: 16
I10-指数 : 23
出版物: 103
NBS standards for microanalysis: certification and applications
E. B. Steel , R. B. Marinenko
Journal of Trace and Microprobe Techniques 4 ( 3) 129 -145
4
1986
Exploring Artifact Signals in Atom Probe Mass Spectra
F. Meisenkothen , E. B. Steel
Microscopy and Microanalysis 23 634 -635
2017
Automated extraction of regular spot arrays from electron diffraction images
D. S. Bright , E. B. Steel
Journal of Microscopy 150 ( 3) 167 -180
3
1988
Problems and Artifacts on Extraction Replicas of Membrane Filters
S. Turner , E. B. Steel , E. S. Landis
MRS Proceedings 199
1990
Chemical Characterization of Silicon-Germanium Single Crystals - Initial Evaluation of the Extent of Heterogeneity
R. B. Marinenko , J. T. Armstrong , S. Turner , E. B. Steel
Microscopy and Microanalysis 8 1490 -1491
2002
A Proposal for a Standard Nomenclature and Interactive Database of Parameters and Correction Algorithms Used in Quantitative Electron Probe Microanalysis.
J. T. Armstrong , J. H. Scott , J. A. Small , E. B. Steel
Microscopy and Microanalysis 9 532 -533
2003
A Multi-Instrument Virtual Collaborative Environment VIA the Worldwide-Web at Nist
B. B. Thorne , E. B. Steel , A. J. Fahey
Microscopy and Microanalysis 4 30 -31
2
1998
Tem Investigation of Co-Si Thin Films on S1-xGex/Si
A. F. Myersa , P. T. Goeller , E. B. Steel , B. I. Boyanov
Microscopy and Microanalysis 4 630 -631
1998
Quality Assurance of Energy Dispersive Spectrometry Systems
E. B. Steel , R. B. Marinenko , R. L. Myklebust
Microscopy and Microanalysis 3 903 -904
2
1997
TEM and EELS Investigation of a-C and ta-C Coated Field Emitters
A. F. Myers , E. B. Steel , M. Q. Dingt , S. M. Camphausen
MRS Proceedings 498
1
1997
Tem Investigation of Titanium Silicide Thin Films
A. F. Myers , E. B. Steel , L. M. Struck , H. I. Liu
MRS Proceedings 523 97
1998
Performance standards for microanalysis
P. Sheridan , G. Hembree , A. Hartman , J. Small
Journal of Trace and Microprobe Techniques 4 ( 3) 147 -161
1986
Analysis of implanted silicon dopant profiles
T.J. Prosa , D. Olson , B. Geiser , D.J. Larson
Ultramicroscopy 132 179 -185
20
2013
Micro X-Ray Fluorescence of Particles Using a Laboratory X-Ray Source and Capillary Optics
J.R. Swider , T. Jach , E. Steel
Microscopy and Microanalysis 5 354 -355
1999
Three-dimensional Structural and Chemical Characterization via STEM of a Candidate Standard Reference Material for Atom Probe Tomography
A. Herzing , K. Henry , E. Steel
Microscopy and Microanalysis 18 580 -581
2012
Understanding Best Practices for Atom Probe Tomography Implant Analysis
T.J. Prosa , D.J. Larson , D. Olson , D. Lawrence
Microscopy and Microanalysis 18 986 -987
2012
" Chemical Science and Technology Laboratory* Materials Science and Technology Laboratory
MR Zachariah , MI Aquino99 , RD Shul19 , EB Steel
NanoStructured Materials 5 ( 4) 383 -392
1995
Report of Investigation
MG Moreno-Ramirez , JR Sieber , EB Steel , BH Toby
A Standard Cr thin-film specimen to measure the X-ray peak-to-background ratio (according to the Fiori definition) in analytical electron microscopy
DB Williams , EB Steel
Analytical Electron Microscopy–1987, ed. Joy DC 228 -230
6
1987
Bright-field image correction with various image-processing tools
DS Bright , EB Steel
Microbeam analysis 517 -520
9
1986