Vijayan Nair
机构: University of Michigan, Ann Arbor
每年引用次数
引用次数
引用: 4,677
H-指数: 33
I10-指数 : 61
出版物: 150
Methodology for feedback variable selection for control of semiconductor manufacturing processes - Part 1: Analytical and simulation results
O.D. Patterson , Xiaobin Dong , P.P. Khargonekar , V.N. Nair
IEEE Transactions on Semiconductor Manufacturing 16 ( 4) 575 -587
9
2003
Methodology for feedback variable selection for control of semiconductor manufacturing processes - Part 2: Application to reactive ion etching
O.D. Patterson , Xiaobin Dong , P.P. Khargonekar , V.N. Nair
IEEE Transactions on Semiconductor Manufacturing 16 ( 4) 588 -597
5
2003
Model-free estimation of defect clustering in integrated circuit fabrication
D.J. Friedman , M.H. Hansen , V.N. Nair , D.A. James
IEEE Transactions on Semiconductor Manufacturing 10 ( 3) 344 -359
74
1997
Some extensions of anova techniques to location-scale models
V.N. Nair
Communications in Statistics-theory and Methods 11 ( 14) 1551 -1570
1982
Unique Optimal Partitions of Distributions and Connections to Hazard Rates and Stochastic Ordering
Vijayan N. Nair , David Mease
Statistica Sinica 16 ( 4) 1299 -1312
16
2006
ON A ZERO-CROSSING PROBABILITY
Colin L. Mallows , Vijayan N. Nair
Annals of the Institute of Statistical Mathematics 41 ( 1) 1 -8
2
1989
Monitoring wafer map data from integrated circuit fabrication processes for spatially clustered defects
Mark H. Hansen , Vijayan N. Nair , David J. Friedman
Technometrics 39 ( 3) 241 -253
110
1997
Maximum likelihood estimation under a successive sampling discovery model
Paul C. C. Wang , Vijayan N. Nair
Technometrics 31 ( 4) 423 -436
23
1989
Analyzing dispersion effects from replicated factorial experiments
Daryl Pregibon , Vijayan N. Nair
Technometrics 30 ( 3) 247 -257
193
1988
On the efficiency and robustness of discrete proportional-integral control schemes
Fugee Tsung , Huaiqing Wu , Vijayan N. Nair
Technometrics 40 ( 3) 214 -222
48
1998
Explainable Neural Networks based on Additive Index Models.
Erind Brahimi , Vijayan N. Nair , Agus Sudjianto , Jie Chen
arXiv: Machine Learning
103
2018
Adaptive Explainable Neural Networks (AxNNs).
Vijayan N. Nair , Agus Sudjianto , Joel Vaughan , Jie Chen
arXiv: Machine Learning
18
2020
SHAP values for Explaining CNN-based Text Classification Models.
Vijayan N. Nair , Agus Sudjianto , Tarun Joshi , Wei Zhao
arXiv: Computation and Language
17
2020
Recent Trends in the Use of Deep Learning Models for Grammar Error Handling.
Vijayan N. Nair , Tarun Joshi , Mina Naghshnejad
arXiv: Computation and Language
3
2020
Supervised Machine Learning Techniques: An Overview with Applications to Banking
Agus Sudjianto , Jie Chen , Hanyu Yang , Joel Vaughan
International Statistical Review
2021
Extremal Depth for Functional Data and Applications
Naveen N. Narisetty , Vijayan N. Nair
Journal of the American Statistical Association 111 ( 516) 1705 -1714
49
2016
On the Behavior of Some Estimators from Probability Plots
Vijayan N. Nair
Journal of the American Statistical Association 79 ( 388) 823 -831
24
1984
Chi-Squared-Type Tests for Ordered Alternatives in Contingency Tables
Vijayan N. Nair
Journal of the American Statistical Association 82 ( 397) 283 -291
41
1987
[A Critical Look at Accumulation Analysis and Related Methods]: Discussion
Vijayan N. Nair
Technometrics 32 ( 2) 151
2
1990
Testing in industrial experiments with ordered categorical data
Vijayan N. Nair
Technometrics 28 ( 4) 283 -311
114
1986
Agus Sudjianto George Michailidis Earl Lawrence Bowei Xi C. F. Jeff Wu William J Welch Raghu N. Kacker Madhav S. Phadke Geoff Vining Angela Fagerlin Fugee Tsung, Fellow of ASA, ASQ, IISE, IAQ Huaiqing Wu Naveen N. Narisetty Brian J. Zikmund-Fisher JB McClure Sarah M. Greene Dylan Smith Peter Ubel Daniel F. Hayes Oliver D Patterson