作者: Gyözö G. Láng , Cesar A. Barbero
DOI: 10.1007/978-3-642-27651-4_5
关键词: Laser 、 Light beam 、 Photodiode 、 Refraction 、 Interferometry 、 Optics 、 Cantilever 、 Materials science 、 Light intensity 、 Detector
摘要: In this chapter, optical methods for the experimental determination of interfacial stress changes in electrochemical systems are discussed. Typical arrangements presented (for “single beam” and “multibeam” systems). The essential components two frequently used methods—the “bending beam method” “Kosters interferometry”—are lasers. main difference between above techniques is detection system: position sensing with photodiodes (“position-sensitive detectors,” PSD) case bending method automated light intensity laser interferometer. Basic principles these have been Possible sources errors analyzed (effect refraction, error due to nonnormal incidence or lateral shift reflected at window, related structure cantilever probe, etc.).