作者: Jason Paul Hadorn , Yusuke Hirayama , Tadakatsu Ohkubo
DOI: 10.1007/S11661-017-4416-Z
关键词: Crystallography 、 Phase (matter) 、 Transmission electron microscopy 、 Surface finish 、 Thin film 、 Fabrication 、 Tetragonal crystal system 、 Crystal structure 、 Materials science 、 Diffraction
摘要: Thin films with compositions of NdFe12 and NdFe11Ti1 were fabricated on W-buffered MgO(001) substrates varying roughness. In this study, X-ray diffraction (XRD) transmission electron microscopy (TEM) used to characterize the microstructurally, chemically, crystallographically. This study revealed successful heteroepitaxial synthesis tetragonal NdFe12−x Ti x phases in Ti-free Ti-containing films, respectively, both surface-normal c-axis orientation. It also presence other within magnetic layer. The contained many α-Fe particles, which preferentially precipitated at locally rough regions W-buffer interface. film showed ubiquitous an Fe2Ti phase, covered most buffer thereby preventing formation α-Fe. phase was determined have a novel Cu2Mg-type cubic Laves (C15) crystal structure fourfold interfacial symmetry, good coherency, low mismatch W-buffer, thus rendering itself as being ideal interface for crystals. is proposed that application underlayer W can contribute development fabrication strategy thin without soft