Characterization of α-Fe-Free Heteroepitaxial NdFe 12−x Ti x Thin-Film Materials with a Novel Cubic Laves Fe 2 Ti Phase

作者: Jason Paul Hadorn , Yusuke Hirayama , Tadakatsu Ohkubo

DOI: 10.1007/S11661-017-4416-Z

关键词: CrystallographyPhase (matter)Transmission electron microscopySurface finishThin filmFabricationTetragonal crystal systemCrystal structureMaterials scienceDiffraction

摘要: Thin films with compositions of NdFe12 and NdFe11Ti1 were fabricated on W-buffered MgO(001) substrates varying roughness. In this study, X-ray diffraction (XRD) transmission electron microscopy (TEM) used to characterize the microstructurally, chemically, crystallographically. This study revealed successful heteroepitaxial synthesis tetragonal NdFe12−x Ti x phases in Ti-free Ti-containing films, respectively, both surface-normal c-axis orientation. It also presence other within magnetic layer. The contained many α-Fe particles, which preferentially precipitated at locally rough regions W-buffer interface. film showed ubiquitous an Fe2Ti phase, covered most buffer thereby preventing formation α-Fe. phase was determined have a novel Cu2Mg-type cubic Laves (C15) crystal structure fourfold interfacial symmetry, good coherency, low mismatch W-buffer, thus rendering itself as being ideal interface for crystals. is proposed that application underlayer W can contribute development fabrication strategy thin without soft

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