作者: I. G. Hill , A. Kahn
DOI: 10.1063/1.371018
关键词: Diamine 、 Materials science 、 Indium tin oxide 、 Anode 、 Heterojunction 、 Biphenyl 、 Photoemission spectroscopy 、 Ultraviolet 、 Organic semiconductor 、 Analytical chemistry
摘要: Ultraviolet photoemission spectroscopy (UPS) was used to study the indium tin oxide/copper phthalocyanine (CuPc) and CuPc/N,N′-diphenyl-N,N′-bis(l-naphthyl)-1,1′biphenyl-1-4,4″diamine interfaces, which are commonly as an anode/hole injection layer/hole transport layer combination in organic light emitting devices. In order assess validity of barriers measured using UPS, vacuo I–V measurements have been performed on simple devices grown same system samples studied UPS. characteristics were modeled numerical simulations. The parameters simulated curves best fit agree quantitatively with UPS barriers.