Off-line learning based adaptive dispatching rule for semiconductor wafer fabrication facility

作者: L. Li , H. Xu

DOI: 10.1109/COASE.2013.6653974

关键词: Off lineWorkflowSemiconductor wafer fabricationScheduling (production processes)Selection algorithmEngineeringReal-time computingLearning basedWeightingSemiconductor device fabrication

摘要: Uncertainties in semiconductor manufacturing fabrication facilities (FABs) requires scheduling methods adaptive to real-time environments. This paper presents an off-line learning based dispatching rule (ADR) whose parameters are tuned dynamically with information relevant scheduling. First, we introduce the framework of ADR composed dynamic dispatching, machine, and simulation model. Secondly, discuss workflow detail. Thirdly, use immune cloning selection algorithm (ICSA) find relations between weighting status adapt these environment. Finally, a real fab model is used demonstrate proposed method. The results show that changing tracking production over time more robust than constant ones, improve movements WIP by about 2%.

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