Patterning substrates employing multiple chucks

作者: Byung-Jin Choi , Sidlgata V. Sreenivasan

DOI:

关键词: OptoelectronicsSubstrate (printing)Process conditionsLithographyMaterials scienceEngineering drawingMoldSpatial relationship

摘要: The present Invention is directed towards a method for patterning first and second substrates in nanoimprlnt lithography system, the including, inter alia, concurrently positioning substrate on chuck; nanoimprint material substrate; removing from chuck while obtaining spatial relationship between mold assembly imprinting pattern with assembly; separating substrate, being subjected to substantially same process conditions.

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