Magnetotransport measurements on a damaged surface ofp-type InAs and the annealing effect
作者： Yukihide Tsuji , Tohru Okamoto
DOI: 10.1103/PHYSREVB.70.245316
关键词: Materials science 、 Magnetoresistance 、 Distribution function 、 Condensed matter physics 、 Conduction electron 、 Semiconductor materials 、 Hall effect 、 Annealing (metallurgy)
摘要:
sci-hub.se 参考文章(12)
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