Integrated circuit having reprogramming cell
作者： David L. Trawick , David A. Courtright
DOI:
关键词: Layer (electronics) 、 Optoelectronics 、 Electronic engineering 、 Spare part 、 Engineering 、 Focused ion beam 、 Integrated circuit 、 Silicon debug 、 Row
摘要: An integrated circuit is reprogrammable in metal using (a) a set of spare devices, and (b) separate arrays rows columns. The are formed the top layer, columns next to layer (for example, layers 4 5 level process). Use rows/columns facilitates silicon debug FIB (focused ion beam) reprogramming without requiring connections more than 500 μm.
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