Molecular mapping of stem and leaf rust resistance in wheat.
作者： R. R. Khan , H. S. Bariana , B. B. Dholakia , S. V. Naik , M. D. Lagu
DOI: 10.1007/S00122-005-0005-4
关键词: Rust 、 Population 、 Cultivar 、 Biology 、 Gene mapping 、 Poaceae 、 Puccinia 、 Genetics 、 RAPD 、 Stem rust
摘要: Stem rust caused by Puccinia graminis f. sp. tritici Eriks and Henn leaf triticina Rob. ex Desm. are major constraints to wheat production worldwide. In the present study, F4-derived SSD population, developed from a cross between Australian cultivars ‘Schomburgk’ ‘Yarralinka’, was used identify molecular markers linked resistance genes Lr3a Sr22. A total of 1,330 RAPD 100 ISSR primers 33 SSR primer pairs selected ob basis chromosomal locations these were used. The marker UBC 840540 found be with in repulsion at distance 6.0 cM. Markers cfa2019 cfa2123 flanked Sr22 5.9 cM (distal) (proximal), respectively. use combination would predict presence or absence breeding populations. previously identified PCR-based diagnostic STS638 Lr20 validated this population. This showed recombination value 7.1 Lr20.
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