作者: Jerry E Chipuk , Seamus J Martin , None
DOI: 10.1111/FEBS.13782
关键词: Research areas 、 Bit (key) 、 Genealogy 、 History 、 Broad spectrum 、 Span (engineering) 、 Field (Bourdieu)
摘要: This Special Issue on Cell Death comprises a series of 12 reviews that span broad spectrum topics within highly active research areas in the cell death field. We hope you will find these pieces to be interest; we certainly found them fresh and engaging are grateful their authors for taking time write The FEBS Journal.