Reduced formation of asperities in contact micro-structures

作者: Bryan Staker , James A. Hunter

DOI:

关键词: BiasingNanotechnologyMetalComposite materialRibbonInsulator (electricity)Micro structureMaterials science

摘要: A device comprising movable micro-structures configured to contact a substrate is disclosed. The has metal-insulator-metal construction with an upper metal layer and insulator being patterned provide regions lower layer. have under layers for providing ribbon non-contact regions. In use, bias voltage applied across the top of causing through During contact, are maintained at potential that substantially less than voltage, thereby reducing formation asperities and/or sticking between contacting parts. preferably structures in optical MEM modulate light.

参考文章(820)
Seiichi Orimo, Michio Hayakawa, Ryuji Nomoto, Yoshitsugu Katoh, Mitsuo Abe, Yoshihiro Kubota, Toshio Hamano, Hiroshi Inoue, Mitsutaka Sato, Semiconductor device and method of producing the same ,(1995)
David Moser, Henry Baltes, CMOS flow sensors ETH, Physical Electronics Laboratory. ,(1993) , 10.3929/ETHZ-A-000700942
Vadlamannati Venkateswar, William E. Nelson, Enhanced resolution for digital micro-mirror displays ,(1994)
Larry D. Mitcham, William E. Nelson, Stereolithographic apparatus and method of use ,(1991)