Determination of Illite-Smectite Structures Using Multispecimen X-ray Diffraction Profile Fitting

作者: Boris A Sakharov , Holger Lindgreen , Alfred Salyn , Victor A Drits

DOI: 10.1346/CCMN.1999.0470502

关键词: X-ray crystallographyClay mineralsSilicateVermiculiteSwellingIlliteGeologyBentoniteMineralMineralogy

摘要: A procedure for structural investigations by X-ray diffraction of mixed-layer structures incorporating swelling layers has been developed. For each sample, specimens saturated with different cations (Na, Mg, and Ca), are analyzed both as air-dried glycolated. One model fitting all the observed patterns then provides structure sample. Samples tested include: Illite-smectite (I-S) minerals from Kazachstan (a rectorite), Dolna Ves in Slovakia, Kinnekulle Sweden, North Sea, Scania Sweden. The rectorite demonstrated that instrumental parameters applied modeling were correct. I-S Slovakia fitted one two-component model. However, Ca-saturated specimen bentonites had two types interlayers. Slovakian Reichweite = 2, an alternative two-phase plus I-V (V vermiculite) experimental equally well. mineral is fact a three-component I-T-S (T tobelite) Sea sample four-component I-S-V-V', type having characteristics intermediately between smectite vermiculite. In addition to layer distribution, interlayer compositions, such amount glycol water fixed exchangeable cations, determined.

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