Thick-lens velocity-map imaging spectrometer with high resolution for high-energy charged particles
作者： N G Kling , D Paul , A Gura , G Laurent , S De
DOI: 10.1088/1748-0221/9/05/P05005
关键词: Spectrometer 、 Charged particle 、 Range (particle radiation) 、 Electron 、 Ionization 、 Laser 、 Physics 、 Imaging spectroscopy 、 Optics 、 Imaging spectrometer
摘要: A novel design for a velocity-map imaging (VMI) spectrometer with high resolution over wide energy range surpassing standard VMI is reported. The main difference to three-electrode the spatial extension of applied field using 11 electrodes forming thick-lens. This permits measurements charged particles higher energies while achieving excellent resolving power energies. Using SIMION simulations, thick-lens compared up 360 eV electrons. simulations also show that new suited charged-particle detection 1 keV repeller-electrode voltage -30 kV. experimental performance tested by laser-induced ionization rare gases producing electrons about 70 eV. useful variety studies on atoms, molecules and nanoparticles in intense laser fields high-photon-energy from high-harmonic-generation or free-electron lasers.
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