Method of measuring the temperature of a photocathode
作者： Avraham Amith , Richard E. Blank , Albert F. Tien
DOI:
关键词: Radiation 、 Infrared 、 Optics 、 Radiation measurement 、 Photocathode 、 Chemistry 、 Apparent temperature 、 Layer (electronics) 、 Interference (communication) 、 Temperature control
摘要: A method of determing the actual temperature a layer an infrared material, especially during heat cleaning, which includes measuring thickness and amount radiation being emitted from it. An apparent corresponding to desired is found curve temperature, are derived amount, versus thickness. The corresponds compensates for interference effects on measurement. computer may be utilized calculated regulate maintain material at temperature.
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