作者: J. H. Claassen
DOI: 10.1007/978-1-4899-2379-0_21
关键词: Penetration depth 、 Edge (geometry) 、 Sample (graphics) 、 Critical current 、 Inductance 、 Materials science 、 Thin film 、 Bulk samples 、 Optoelectronics 、 Superconductivity
摘要: The techniques of ac susceptibility have been used to evaluate several properties thin films: critical temperature, current density, and penetration depth. Two basic approaches used. first I would call “conventional”, in that the sample is mounted a conventional apparatus normally measure bulk samples. Here drive receive coils are both large compared lateral dimensions sample. A second approach unique films involves small These generally designed couple only region near center sample, thus being insensitive exact size or details outer edge film.