作者: S. Gąsiorek , P.K. Sahoo , K.P. Lieb , S. Dhar , T. Sajavaara
DOI: 10.1016/J.JNONCRYSOL.2006.04.019
关键词: Doping 、 Analytical chemistry 、 Crystal growth 、 Annealing (metallurgy) 、 Channelling 、 Epitaxy 、 Elastic recoil detection 、 Ion implantation 、 Cathodoluminescence 、 Materials science
摘要: Abstract Even at low fluences doping of quartz by ion implantation results in amorphization. Here we report on the measurement cathodoluminescence and surface structures during solid phase epitaxy Na-implanted α-quartz annealed 18O2 atmosphere. Complete was achieved under appropriate conditions fluence, annealing temperature time. The crystalline structure samples studied Rutherford backscattering channelling spectroscopy 18O–16O exchange between matrix gas elastic recoil detection analysis. In spectra taken room temperature, five bands were identified assigned to various defect centres. Two violet region 3.25 3.65 eV strongly vary intensity 843–1173 K appear be intimately correlated with presence Na-ions implanted matrix. Finally, atomic force microscopy enabled, for first time, observation correlation epitaxy.