Empirical Correction Factors for the Electron Microanalysis of Silicates and Oxides

作者: A. E. Bence , A. L. Albee

DOI: 10.1086/627339

关键词: Binary numberLine (formation)ElectronAlloyMicroanalysisOxideIntensity (heat transfer)Calibration curveGeologyAnalytical chemistry

摘要: Given suitable correction factors, the use of pure oxides and binary oxide phases as standards would make electron microanalysis independent chemical analyses problems sample inhomogeneity. Ziebold Ogilvie (1964) have shown that calibration curve in a metal alloy system can, within variance data points, be described by linear expression $$C_{A}/K_{A} = \alpha_{AB} + (1 - \alpha_{AB})C_{A}$$, where $$C_{A }$$ is concentration element A Ârelative to A, $$K_{A}$$ background-corrected intensity characteristic radiation line relative A. This variation factor with composition can extended multicomponent systems using weighted average factors. Correction factors been determined empirically for lines ten major elements (Na, Mg, Al, Si, K, Ca, Ti, Cr, Mn, Fe) corresponding on pseudob...

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