Apparatus and method for controlling the reliability stress rate on a processor
作者： Krishnakanth V. Sistla , Efraim Rotem , Nadav Shulman , Shmulik Zobel , Allen Chu
DOI:
关键词: Computer hardware 、 Stress control 、 Speech recognition 、 Stress (mechanics) 、 Reliability (semiconductor) 、 Computer science 、 Stress rate
摘要: An apparatus and method for tracking stress on a processor responsively controlling operating conditions. For example, one embodiment of comprises: logic to determine experienced by or more portions the based current conditions processor; control characteristics determined target accumulation rate.
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