作者: Nodira Khoussainova , Magdalena Balazinska , Dan Suciu
DOI: 10.1109/ICDE.2008.4497596
关键词: Artificial intelligence 、 Computer science 、 Probabilistic logic 、 Event (computing) 、 Ambiguity 、 Data mining 、 Pattern recognition 、 Feature extraction 、 Extraction (military)
摘要: We present PEEX, a system that enables applications to define and extract meaningful probabilistic high-level events from RFID data. PEEX effectively copes with errors in the data inherent ambiguity of event extraction.