作者: I. Smolski , J.J. De Yoreo , N.P. Zaitseva , J.D. Lee , T.A. Land
DOI: 10.1016/S0022-0248(96)00481-2
关键词: Crystallography 、 Optical microscope 、 In situ atomic force microscopy 、 Inclusion (mineral) 、 Chemical physics 、 Chemistry
摘要: We describe a particular type of defect in KDP that consists oriented chains liquid inclusions. Using optical microscopy and X-ray topography we show these inclusions are not directly formed by dislocations. The results situ atomic force hollow channels stable during growth they can be caused inclusion foreign particles.