Gated four-probe measurements on pentacene thin-film transistors: Contact resistance as a function of gate voltage and temperature

作者: Paul V. Pesavento , Reid J. Chesterfield , Christopher R. Newman , C. Daniel Frisbie

DOI: 10.1063/1.1806533

关键词: Atmospheric temperature rangeElectrodePentaceneThin-film transistorOptoelectronicsElectron mobilityContact resistanceMaterials scienceOrganic semiconductorSheet resistance

摘要: … Here, we report variable-temperature contact resistance … allows variable-temperature resistance measurements without the … study of contact resistance in top contact pentacene OTFTs …

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