作者: L. H. Germer , A. U. MacRae , C. D. Hartman
DOI: 10.1063/1.1777087
关键词: Crystallography 、 Oxygen 、 Atom 、 Plane (geometry) 、 Nickel 、 Chemistry 、 Surface (mathematics) 、 Electron diffraction 、 Crystal 、 Layer (electronics)
摘要: Nickel (110) surfaces, in clean and nearly conditions, have been studied by low‐energy electron diffraction. When free from foreign atoms, the surface plane of atoms has normal arrangement expected for such a plane. Very slight contamination oxygen (and perhaps other atoms) results, some cases, an topmost layer which nickel (or another atom) alternate along each [100] line also [110] line. Study shown that superficial half‐layer is displaced toward bulk crystal about 0.10 A.