Microstructure of X7R type base-metal-electroded BaTiO3 capacitor materials Co-doped with MgO/Y2O3 additives
作者： Cheng-Sao Chen , Chen-Chia Chou , I-Nan Lin
DOI: 10.1007/S10832-004-5159-Y
关键词: Capacitor 、 Ceramic capacitor 、 Electrochemistry 、 Co doped 、 Composite material 、 Transmission electron microscopy 、 Microstructure 、 Nanotechnology 、 Materials science 、 Dielectric 、 Base metal
摘要: Detailed microstructure of MgO/Y2O3 co-doped BaTiO3 materials were examined using transmission electron microscopy (TEM). For the 1250_∘C-sintered samples possessing flat K-T characteristics, which meet X7R specification, granular structure is complicated. Most grains are very small (∼ 150 nm) and highly strained. The contain large proportion Y2O3 species paraelectric, whereas unevenly distributed core-shell structure. In contrast, for 1300∘C-sintered samples, have properties slightly off grew larger to around 300 nm. structured seldom observed. Apparently, it existence such a non-equilibrium microstructure, renders dielectric extremely sensitive processing parameters.
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