作者: Einar S Mathisen
DOI:
关键词: Transparency (projection) 、 Fourier transform 、 Wafer 、 Positioning system 、 Photomask 、 Semiconductor 、 Optics 、 Holography 、 Materials science 、 Spatial filter
摘要: System and method for automatic alignment of workpieces such as semiconductor wafers a photomask subsequent image exposure. Alignment is based on the transparency to infrared light opaqueness thereto patterns fabricated in wafer. A holographic optical system generates Fourier transformed transmitted through wafer cross-correlates with complex spatial filter generate recognition spots having spot displacements corresponding waferfilter nonalignment. The an error signal used control position.