Equivalent Capacitance Approach to Calculate Effective Roughness Dielectric Parameters for Copper Foils on Printed Circuit Boards

作者: Marina Y. Koledintseva , Tracey Vincent

DOI: 10.4071/IMAPS.654479

关键词: Thin layersMaterials scienceLayer (electronics)Composite materialConductorDissipation factorDielectricFOIL methodPrinted circuit boardSurface finish

摘要: Effective roughness dielectric (ERD) is a homogeneous lossy layer of certain thickness with effective (averaged) parameters. The ERD used to model copper foil in printed circuit board interconnects by being placed on smooth conductor surface substitute an inhomogeneous transition between and laminate substrate dielectric. This work derives the parameters based understanding that there gradual variation concentration metallic inclusions foil. can be structured as thin layers are obtained using equivalent capacitance approach. profile extracted from scanning electron microscopy or high-resolution optical microscopy. As particles increases along axis normal boundary, two regions discerned: insulating (prepercolation) region conducting (pe...

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