作者: Carl A. Listl , Henry Seiwatz , J. Michael Donahue , David F. Lewis
DOI:
关键词: Optical density 、 Dosimeter 、 Radiation 、 Radiation exposure 、 Substrate (electronics) 、 Optoelectronics 、 Materials science 、 Bar (music) 、 Optics 、 Layer (electronics)
摘要: In a method for manufacturing calibrated radiation dosimeter, layer of sensitive material is applied to substrate, the having an optical density which varies in accordance with degree exposure. A pre-exposure optically measured and subsequently exposed known dose radiation. Thereafter, post-exposure measured. Using at least density, radiation, one computes mathematical parameters defining predetermined function. The computed are encoded form substrate (e.g., printed bar code on or holder card).