In situ synchrotron X‐ray studies of PbTiO3 thin films

作者: D.D. Fong , C. Thompson , S.K. Streiffer , J.A. Eastman , O. Auciello

DOI: 10.1002/ANDP.200310037

关键词: Thin filmOpticsCurie temperatureFerroelectricityChemical vapor depositionMaterials scienceScatteringPhase (matter)Condensed matter physicsEpitaxySynchrotron

摘要: We have used in situ synchrotron x-ray scattering to investigate PbTiO3 films grown epitaxially on SrTiO3 (001) substrates. When the are cooled below a thickness-dependent Curie temperature, ferroelectric phase forms as 180° stripe domains with well-defined period. With further cooling, period changes fairly abruptly from lower higher value, suggesting transition between two domain phases. The periods of both phases observed depend square root film thickness, agreement theory.

参考文章(0)