General bidirectional thermal characterization via the 3ω technique.
作者： Matthew L. Bauer , Pamela M. Norris
DOI: 10.1063/1.4884638
关键词: Mechanical engineering 、 Thermal conductivity measurement 、 Microscale chemistry 、 Contact resistance 、 Volumetric heat capacity 、 Thermal conductivity 、 Sensitivity (control systems) 、 Materials science 、 Characterization (materials science) 、 Thermal contact conductance
摘要: The 3ω technique has become a popular method for determining the thermophysical properties of microscale and bulk materials. The prerequisite fabrication of a highly linear metal line …
scitation.org
harvard.edu
aip.org
sci-hub.se 参考文章(26)
Tao Tong, Arun Majumdar, Reexamining the 3-omega technique for thin film thermal characterization Review of Scientific Instruments. ,vol. 77, pp. 104902- ,(2006) , 10.1063/1.2349601
David G. Cahill, R. O. Pohl, Thermal conductivity of amorphous solids above the plateau. Physical Review B. ,vol. 35, pp. 4067- 4073 ,(1987) , 10.1103/PHYSREVB.35.4067
Brandon W. Olson, Samuel Graham, Kuan Chen, A practical extension of the 3ω method to multilayer structures Review of Scientific Instruments. ,vol. 76, pp. 053901- ,(2005) , 10.1063/1.1896619
M.L. Bauer, C.M. Bauer, M.C. Fish, R.E. Matthews, G.T. Garner, A.W. Litchenberger, P.M. Norris, Thin-film aerogel thermal conductivity measurements via 3ω Journal of Non-crystalline Solids. ,vol. 357, pp. 2960- 2965 ,(2011) , 10.1016/J.JNONCRYSOL.2011.03.042
A. Jacquot, F. Vollmer, B. Bayer, M. Jaegle, D. G. Ebling, H. Böttner, Thermal Conductivity Measurements on Challenging Samples by the 3 Omega Method Journal of Electronic Materials. ,vol. 39, pp. 1621- 1626 ,(2010) , 10.1007/S11664-010-1265-6
David G. Cahill, M. Katiyar, J. R. Abelson, Thermal conductivity of a -Si:H thin films Physical Review B. ,vol. 50, pp. 6077- 6081 ,(1994) , 10.1103/PHYSREVB.50.6077
C. E. Raudzis, F. Schatz, D. Wharam, Extending the 3ω method for thin-film analysis to high frequencies Journal of Applied Physics. ,vol. 93, pp. 6050- 6055 ,(2003) , 10.1063/1.1569663
David G. Cahill, Thermal conductivity measurement from 30 to 750 K: the 3ω method Review of Scientific Instruments. ,vol. 61, pp. 802- 808 ,(1990) , 10.1063/1.1141498
S.-M. Lee, David G. Cahill, Heat transport in thin dielectric films Journal of Applied Physics. ,vol. 81, pp. 2590- 2595 ,(1997) , 10.1063/1.363923
Patrick E. Hopkins, Bryan Kaehr, Leslie M. Phinney, Timothy P. Koehler, Anne M. Grillet, Darren Dunphy, Fred Garcia, C. Jeffrey Brinker, Measuring the Thermal Conductivity of Porous, Transparent SiO2 Films With Time Domain Thermoreflectance Journal of Heat Transfer-transactions of The Asme. ,vol. 133, pp. 061601- ,(2011) , 10.1115/1.4003548