Calculation of the long-range order parameter from atom probe data
作者： S. Welzel , S. Duval , E. Camus , D. Blavette
DOI: 10.1016/S0966-9795(97)00029-0
关键词: Diffraction 、 Atom probe 、 Range (statistics) 、 Superstructure (condensed matter) 、 Materials science 、 Metallurgy 、 Molecular physics 、 Microscopy 、 Chemical species 、 Evaluation methods 、 Order (group theory)
摘要: Abstract In addition to the known diffraction techniques, field-ion microscopy with atom probe is well established for determining long-range order parameter. The site occupation probabilities of chemical species on different sublattices may be estimated from experimental profiles. However, this evaluation method demands that superstructure planes identified unequivocally data. This condition not fulfilled in all cases. We propose a new analytical which need met.
archives-ouvertes.fr
elsevier.com
sci-hub.se 参考文章(11)
G. D. W. Smith, M. K. Miller, Atom Probe Microanalysis: Principles and Applications to Materials Problems ,(1989)
Eric Camus, Christian Abromeit, Analysis of conventional and three‐dimensional atom probe data for multiphase materials Journal of Applied Physics. ,vol. 75, pp. 2373- 2382 ,(1994) , 10.1063/1.356258
Charles A. Johnson, Jerome H. Klotz, The Atom Probe and Markov Chain Statistics of Clustering Technometrics. ,vol. 16, pp. 483- 493 ,(1974) , 10.1080/00401706.1974.10489229
Jerome Klotz, Statistical Inference in Bernoulli Trials with Dependence Annals of Statistics. ,vol. 1, pp. 373- 379 ,(1973) , 10.1214/AOS/1176342377
Albert T. Macrander, Masahiko Yamamoto, David N. Seidman, S. S. Brenner, Statistics of the atom‐by‐atom dissection of planes in an atom‐probe field‐ion microscope: The number of atoms detected per plane Review of Scientific Instruments. ,vol. 54, pp. 1077- 1084 ,(1983) , 10.1063/1.1137527
Z. G. Liu, G. Frommeyer, M. Kreuss, Microchemical and microstructural investigations on two‐phase intermetallic TiAl/Ti3Al alloys by field ion microscopy and atom probe (APFIM) Physica Status Solidi (a). ,vol. 131, pp. 495- 508 ,(1992) , 10.1002/PSSA.2211310223
D. Blavette, The role of atom-probe techniques in the investigation of some selected metallurgical problems Surface Science. ,vol. 266, pp. 299- 309 ,(1992) , 10.1016/0039-6028(92)91037-C
D. Blavette, A. Bostel, J. M. Sarrau, Atom-probe microanalysis of a nickel-base superalloy Metallurgical Transactions A. ,vol. 16, pp. 1703- 1711 ,(1985) , 10.1007/BF02670358
S. Duval, S. Chambreland, P. Caron, D. Blavette, Phase composition and chemical order in the single crystal nickel base superalloy MC2 Acta Metallurgica et Materialia. ,vol. 42, pp. 185- 194 ,(1994) , 10.1016/0956-7151(94)90061-2
J. Wesemann, G. Frommeyer, M. Kreuss, APFIM investigations on ordered γ-TiAl using single-layer detection method Applied Surface Science. pp. 179- 184 ,(1995) , 10.1016/0169-4332(94)00483-8