作者: Dietrich Menzel
DOI: 10.1007/978-1-4615-9537-3_15
关键词: Delocalized electron 、 Ionization 、 Plasma 、 Desorption 、 Context (language use) 、 Electron 、 Materials science 、 Atomic physics 、 Ion 、 Absorption (chemistry)
摘要: To a varying degree, virtually all surface spectroscopies and microscopies using electrons, photons and/or ions suffer from beam damage effects. These can become so important that they effectively limit the obtainable resolution sensitivity in particular application. In large fraction of applications, these beam-induced effects are eventual consequence primary electronic excitations, term which will be used to include ionization. One possible final consequences is release particles into vacuum, i.e. “Electronically Stimulated Desorption” (ESD; this here stimulation by photon absorption) or “Desorption Induced Electronic Transitions” (DIET). This subject has been studied its own right for over 25 years now contributed considerably basic knowledge about adsorbate their coupling bulk, screening, delocalization, deexcitation1–4. context volume, as well other practically cases, such total partial pressure measurements, ultimate attainable vacuum gas purity UHV systems enclosing energetic — plasma devices accelerators/storage rings processes have negative importance, disturbing avoided: easier if mechanisms understood.