Reducing electron beam damage through alternative STEM scanning strategies. Part I -- Experimental findings.
作者： Armand Béché , Johan Verbeeck , Abner Velazco , Daen Jannis
DOI:
关键词: Raster scan 、 Transmission electron microscopy 、 Materials science 、 Optics 、 Electron 、 Cathode ray 、 Acceleration voltage 、 Dose rate 、 Sample (material) 、 Beam (structure)
摘要: … Here we take on the experimental challenge to investigate the role of the STEM scan pattern on the damage behavior of a commercially available zeolite sample with the clear aim to …
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