Factors associated with biaxial texturing of Cu tapes for YBCO coated conductors
作者： YH Kim , TH Sung , SC Han , YH Han , NH Jeong
DOI: 10.1016/J.PHYSC.2007.03.461
关键词: High-temperature superconductivity 、 Electrical conductor 、 Annealing (metallurgy) 、 Recrystallization (metallurgy) 、 Composite material 、 Materials science 、 Full width at half maximum
摘要: Abstract A biaxially textured Cu(2 0 0) tape was used as a substrate for YBCO coated conductors by cold rolling followed recrystallization heat treatment. In this work, we studied the influence of annealing conditions and final thickness on process. Phi ( ϕ ) scan omega ω XRD revealed that best in-plane out-of-plane alignment Cu (thickness 100 μm), measured in terms full width half maximum (FWHM) values 6.64° 4.49°, were obtained at 800 °C 30 min. The texture CeO 2 buffer layer thermally-evaporated also analyzed.
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