作者: Andrea Castoldi , Chiara Guazzoni , Cigdem Ozkan , Giorgio Vedani , Robert Hartmann
DOI: 10.1017/S1431927609090291
关键词: Materials science 、 Fluorescence-lifetime imaging microscopy 、 Optoelectronics 、 X-ray spectroscopy 、 Detector 、 Synchrotron 、 Energy (signal processing) 、 Chip 、 Wafer 、 Pixel
摘要: A detector that looks promising for advanced imaging modalities--such as X-ray absorption contrast imaging, fluorescence and diffraction-enhanced imaging--is the controlled-drift (CDD). The CDD is a novel two-dimensional imager with energy resolving capability of spectroscopic quality. It built on fully depleted silicon wafer features fast readout while being operated at or near room temperature. use CDDs in aforementioned applications allows translating these techniques from synchrotron-based experiments to laboratory-size using polychromatic generators. We have dedicated versatile detection module based 36 mm2 chip featuring pixels 180 x microm 2, we evaluated system performance different both laboratory environment.