Evaluation of controlled-drift detectors in X-ray spectroscopic imaging applications.

作者: Andrea Castoldi , Chiara Guazzoni , Cigdem Ozkan , Giorgio Vedani , Robert Hartmann

DOI: 10.1017/S1431927609090291

关键词: Materials scienceFluorescence-lifetime imaging microscopyOptoelectronicsX-ray spectroscopyDetectorSynchrotronEnergy (signal processing)ChipWaferPixel

摘要: A detector that looks promising for advanced imaging modalities--such as X-ray absorption contrast imaging, fluorescence and diffraction-enhanced imaging--is the controlled-drift (CDD). The CDD is a novel two-dimensional imager with energy resolving capability of spectroscopic quality. It built on fully depleted silicon wafer features fast readout while being operated at or near room temperature. use CDDs in aforementioned applications allows translating these techniques from synchrotron-based experiments to laboratory-size using polychromatic generators. We have dedicated versatile detection module based 36 mm2 chip featuring pixels 180 x microm 2, we evaluated system performance different both laboratory environment.

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