作者: Joseph V. Smith , William L. Brown
DOI: 10.1007/978-3-642-72594-4_13
关键词: Minor element 、 Accuracy and precision 、 TRACE (psycholinguistics) 、 Mechanical engineering 、 Electron microprobe 、 Computer science
摘要: This chapter is deliberately brief. It impossible to cover the technical details of all analytical techniques applicable feldspars. Emphasis placed here on developments since 1974, and readers are referred 2, 3-14 for earlier work. Most analyses major elements in feldspars now made routinely with an electron probe, principal challenges concern trace minor elements. Because small amounts mechanical impurities can cause significant bias bulk these latter constituents, micro- probe have been or being developed; involve bombardment by focused electron, proton, ion X-ray beams. Physical (Chap. 11) providing important information structural locations