Fabrication of amorphous Zr48Cu36Al8Ag8 thin films by ion beam sputtering and their corrosion behavior in SBF for bio implants
作者： B. Subramanian , S. Yugeswaran , Akira Kobayashi , M. Jayachandran
DOI: 10.1016/J.JALLCOM.2013.03.099
关键词: Simulated body fluid 、 Amorphous metal 、 High-resolution transmission electron microscopy 、 Amorphous solid 、 Sputtering 、 Materials science 、 Composite material 、 Metallurgy 、 Corrosion 、 Electron diffraction 、 Thin film
摘要: Abstract The growth of multi component amorphous Zr 48 Cu 36 Al 8 Ag thin film metallic glasses (TFMGs) using single target ion beam sputtering has been systematically investigated. as prepared was crystalline in nature. presence the constituent elements identified from EPMA and AES analysis. An atomically disordered structure observed by micro X-ray diffraction, electron diffraction high resolution transmission microscopy. Glassy films with smooth surfaces order 0.4 nm higher nanohardness 9.33 GPa Young’s modulus 117 GPa compared to their substrate nanoindentation study vitro corrosion these coatings on implantable 316L stainless steel simulated body fluid (SBF) indicated that sputtered specimen had resistance without any localized pitting.
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