作者: W. Langbein
DOI: 10.1002/1521-3951(200211)234:1<84::AID-PSSB84>3.0.CO;2-Y
关键词: Secondary emission 、 Quantum well 、 Polarization (waves) 、 Semiconductor quantum wells 、 Speckle pattern 、 Spectral hole burning 、 Optics 、 Physics 、 Time resolved spectra
摘要: The technique of the speckle analysis resonant secondary emission is reviewed. It a novel, linear optical to measure microscopic intensity and polarization dynamics in inhomogeneously broadened ensembles, that represents an alternative for established non-linear techniques such as photon-echo or spectral hole burning. Both time-resolved spectrally resolved variants are discussed. Experimental results obtained on semiconductor quantum wells using both presented.