XPS analysis of palladium oxide layers and particles

作者: E.H. Voogt , A.J.M. Mens , O.L.J. Gijzeman , J.W. Geus

DOI: 10.1016/0039-6028(96)01028-X

关键词: SinteringParticle sizeMonolayerOxideX-ray photoelectron spectroscopyChemistryFOIL methodMetalAnalytical chemistryPalladium

摘要: Abstract The thermal reduction of both oxidised palladium foil and SiO 2 Si (100) supported oxide particles, ranging in size fro 3.5 to 13 nm, was investigated with XPS. Equations were derived for the XPS intensities, measured at normal emission angles, particles which consisted a metallic core an oxidic skin. By applying these equations on spectra after each step, particle calculated. Measurements showed that layer thickness decreases linearly time up last monolayer oxide. rate surface is about eight times lower than bulk growth appeared be proportional area. smallest comparable foil. larger behave identical

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