MeV proton backscattering analysis of ion implanted polymers
作者： L. Calcagno , G. Foti
DOI: 10.1016/0168-583X(86)90305-8
关键词: Proton 、 Analytical chemistry 、 Radiochemistry 、 Polymer 、 Hydrogen content 、 Irradiation 、 Hydrogen 、 Stoichiometry 、 Materials science 、 Ion 、 Outgassing
摘要: Abstract MeV proton backscattering has been used to detect stoichiometry change of ion implanted polymers (CHx). Hydrogen outgassing is the main effect observed during polymer irradiation and hydrogen content can be reduced by a factor two compared initial value.
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