Trace Element Analysis of Silicates by Ion Microprobe
作者： C. Meyer
DOI: 10.1007/978-3-642-61871-0_20
关键词: Analytical chemistry 、 Trace element analysis 、 Trace element 、 Silicate 、 Ion 、 Silicon 、 Materials science 、 Microprobe
摘要: Quantitative ion microprobe analysis of silicates for trace element concentrations requires the close intercomparison unknowns with standards using identical instrumental conditions and an internal standard such as silicon. Data from various silicate can be compared by relative sensitivities elements calculated respect to silicon [1].
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