The post-growth effect on the properties of Cu2ZnSnS4 thin films

作者: Zeineb Seboui , Abdelaziz Gassoumi , Yvan Cuminal , Najoua Kamoun Turki

DOI: 10.1063/1.4908063

关键词: Analytical chemistryCrystallinityBand gapKesteriteAnnealing (metallurgy)Absorption edgeRaman spectroscopyCZTSMaterials scienceThin film

摘要: Cu2ZnSnS4 (CZTS) thin film was deposited on glass substrate by spray pyrolysis technique using a methanolic solution. This annealed under nitrogen atmosphere for an hour at different annealing temperatures. The effect of the temperature composition, structure, morphology, electrical, and optical properties CZTS films investigated. Energy dispersive x-ray analysis showed that after process, atomic ratio values tend to their stoichiometric values. Moreover, X-ray diffraction (XRD) Raman spectroscopy revealed kesterite structure with (112) preferential orientation both as-deposited films. they exhibited improvement in crystallinity which confirmed SEM analysis. conductivity heated also important increase crystallinity. absorption edge shifted toward lower wavelengths leading band gap energy

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