Trace elements and dating studies of teeth by secondary ion mass spectrometry (SIMS)

作者: A.R.E. Lodding , P.M. Fischer , J.G. Noren

DOI:

关键词: BariumLithiumEnamel paintMagnesiumBoronDentinSecondary ion mass spectrometryInorganic chemistryStrontiumMaterials science

摘要: A secondary ion mass spectrometer (SIMS) has been used on an archaeological tooth material from Cyprus, dating ca. 1750-950 BC. Lithium, sodium, potassium, magnesium, strontium, barium, zinc, boron, calcium, silicon, tin, lead, iron, fluorine, and chlorine were analyzed in enamel dentin. Clear systemic differences detected between the distributions of 12 elements recently extracted teeth. The following tendencies could be observed as consequences prolonged burial: 1) strong absorption fluorine both plateaus, i.e., well-defined parts dentine; 2) clear lithium, zinc plateaus; plateau also lead tin boron dentine plateau; 3) leaching-out for especially dentine. Sodium remain nearly unaffected by burial. If time dependence, concentration plateau, is found reproducible, SIMS study might provide a new technique material.

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